Reported by: QIN Yong
Translated by: WEI Hongjia
Edited by: Jennifer Taylor
Updated by: 2012/10/26
HIT ranks in the top three in terms of the amount of funds and the number of programs approved in the recent Senior Foreign Experts Program decisions announced by the State Administration of Foreign Experts Affairs (SAFEA). HIT applied for ten programs and seven were approved.
The seven approved programs are:
1. On Fundamental Problems of the Flight Model Parameter Identification
2. Ultra-precision Multiple Scale Absolute Distance Measurement Based on Tunable and Multiple Wavelength Semiconductor Laser Interferometric Theory
3. Representations of Si60
4. Development of Ultrahigh Resolution Reflex Three-dimensional Tomographic Confocal Microscope
5. On the Reliability of the Usage and Storage of Metal-rubber Materials in Special Environment like Aerospace
6. Harbin-Arhus International Center of Multiscale Interface Chemistry and Engineering
7. Wireless Sensor Network System Based on UAV
The Senior Foreign Experts Program relates to the national and local development strategic goal in the Twelfth Five Year Plan and the national talent strategy, and is intended to ensure the implementation of the Recruitment Program of Foreign Experts. It focuses on the recruitment of talents including scientists who can break through key technology, develop high-tech industry, lead new scientific disciplines, including internationally renowned experts and leading high-tech talents. As a supporting program of the Recruitment Program of Foreign Experts, the Senior Foreign Experts Program mainly funds foreign experts who meet the standards of the Recruitment Program of Foreign Experts to come to China and work for one to three months. The amount of funding provided ranges from 40,000-90,000 RMB/month. It provides another effective channel for HIT to recruit top overseas talents and makes the recruitment sustainable with the Foreign Experts Program, Senior Foreign Experts Program and Recruitment Program of Foreign Experts working together.
